Transmission electron microscopy (TEM) of Maniitsoq zircon grain P2–11 at section #7252, with position shown in c. The imaged foil is perpendicular to the polished surface. a–a’: TEM bright field images. The wavy subhorizontal bands in a’ are diffraction contrast. b: high-angle annular dark field image of the same nanoscale structure Several subvertical, narrow (50–100 nm) and closely spaced dislocation arrays are visible (black arrows), one of which is accompanied by a narrow trail of fluid inclusions ~20–50 nm across (orange arrow). Another narrow dislocation trail is accompanied by a wider zone of such fluid inclusions. Two much wider dislocation arrays (up to ~0.8 μm wide) are also present, marked by curled brackets. The nanoscale structures revealed by the TEM imaging can be correlated with the longitudinal planar microstructures mapped by BSE and EBSD imaging (c-d, from Fig. 7).